Probing Electromigration of Oxygen Vacancies in YBaCuO Devices by Multimodal X-ray Techniques
By integrating multimodal X-ray techniques with electrical and optical measurements, this study reveals that pulsed electromigration in YBaCuO microbridges induces consistent, depth-dependent oxygen vacancy redistribution and crystallographic changes, while demonstrating that optical microscopy alone is insufficient for characterizing irreversible bipolar electromigration effects.