Linear dichroic soft X-ray microscopy of ferroelectric stripe domains in epitaxial K0.6Na0.4NbO3
This paper demonstrates that locally back-thinning epitaxial substrates enables linear dichroic soft X-ray microscopy to resolve nanoscale ferroelectric stripe domains in K0.6Na0.4NbO3 thin films, overcoming previous substrate absorption limitations and establishing a method for time-resolved studies of strain-stabilized domain structures.
M. Schneider, T. A. Butcher, S. Wagner, D. Metternich, C. Klose, E. Malm, R. Battistelli, V. Deinhart, J. Fuchs, S. Wittrock, T. Karaman, K. Puzhekadavil Joy, M. Patras, F. Büttner, S. Wintz, M. Wei (…)2026-03-17🔬 cond-mat.mtrl-sci