Dynamical diffraction formalism for imaging time-dependent diffuse scattering from coherent phonons with Dark-Field X-ray Microscopy
This paper presents a dynamical diffraction formalism based on the Takagi-Taupin equations that enables Dark-Field X-ray Microscopy to overcome the frequency resolution limits of traditional Bragg-peak tracking, allowing for quantitative, depth-resolved imaging of coherent phonon decay and interactions in bulk materials through time-dependent intensity oscillation sidebands.