Mortality of ultra-thin LGADs and PiN diodes from high energy deposition
This study investigates the mortality mechanisms of ultra-thin Low Gain Avalanche Diodes and PiN diodes under high-energy particle irradiation by pre-irradiating devices and exposing them to proton and heavy ion beams, identifying distinct electrical and mechanical damage signatures to better understand and mitigate permanent radiation damage like Single Event Burnout in future high-radiation detector applications.