Granularity Noise Limit in Atomic-Ensemble-Based Metrology
This paper challenges the conventional continuous-medium approximation in atomic-ensemble sensing by introducing a discrete-atom framework that reveals an intrinsic "atomic granularity noise" (AGN), demonstrating that increasing optical probe power can paradoxically degrade sensitivity and establishing a fundamental limit where quantum-enhanced metrology fails once the photon-to-atom flux ratio exceeds a critical threshold.