Circuit-Level vs Pulse-Level Quantum Hardware Diagnostics: K–R Scaling Exponent Detects Device Degradation Invisible to T₁/T₂ Calibration
This paper demonstrates that circuit-level diagnostics using the K–R scaling exponent can detect significant device degradation and predict algorithm failures that remain invisible to standard pulse-level T₁/T₂ coherence metrics, as evidenced by a case where reported T₂ improvements coincided with a 920% increase in circuit error on IBM Heron processors.