High-resolution resonant inelastic X-ray scattering study of W-L3 edge in WSi2
This study demonstrates the feasibility of using tungsten disilicide (WSi2) as a two-level system for X-ray quantum optics by employing high-resolution resonant inelastic X-ray scattering to resolve a sharp white line and a discrete 2p-5d transition at the W-L3 edge, overcoming challenges posed by natural linewidth broadening.