Flux Trapping Characterization for Superconducting Electronics Using a Cryogenic Widefield NV-Diamond Microscope
This paper introduces a cryogenic widefield NV-diamond microscope that enables rapid, micrometer-scale imaging of magnetic flux trapping in superconducting devices, revealing critical vortex expulsion behaviors in Nb thin films and offering a high-throughput tool for improving the reliability of scalable superconducting electronics.
Rohan T. Kapur, Pauli Kehayias, Sergey K. Tolpygo, Adam A. Libson, George Haldeman, Collin N. Muniz, Alex Wynn, Nathaniel J. O'Connor, Neel A. Parmar, Ryan Johnson, Andrew C. Maccabe, John Cummings, Justin L. Mallek, Danielle A. Braje, Jennifer M. SchlossTue, 10 Ma⚛️ quant-ph