Probing the Dynamics of Two-Level System Defect Ensembles via Broadband Cryogenic Transient Dielectric Spectroscopy
This paper introduces Broadband Cryogenic Transient Dielectric Spectroscopy (BCTDS), a novel wafer-level technique that utilizes transient phase dynamics under strong microwave excitation to characterize the frequency-dependent behavior and thermocycling-induced shifts of two-level system (TLS) defects in dielectrics, thereby offering a powerful tool for understanding decoherence sources in superconducting quantum circuits.