Flux Trapping Characterization for Superconducting Electronics Using a Cryogenic Widefield NV-Diamond Microscope
This paper introduces a cryogenic widefield NV-diamond microscope that enables rapid, micrometer-scale imaging of magnetic flux trapping in superconducting devices, revealing critical vortex expulsion behaviors in Nb thin films and offering a high-throughput tool for improving the reliability of scalable superconducting electronics.