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Quantification of sidewall defects and surface passivation strategies in blue InGaN/GaN micro light emitting diodes

This study quantifies the impact of plasma-induced sidewall defects on blue InGaN/GaN micro-LED efficiency by combining spatially resolved micro-cathodoluminescence and electrical characterization to reveal a ~1 µm damaged region with significantly elevated non-radiative recombination, while demonstrating that KOH wet etching and SiO₂ passivation effectively mitigate the resulting size-dependent efficiency droop.

Original authors: Lee-Woon Jang, Sang-Ik Lee, Andrej Kuznetsov, A.L. Zakgeim, E.B. Yakimov, Pil-Kyu Jang, Anton E. Chernyakov, Luiza A. Alexanyan, M. L. Skorikov, Ivan V. Shchemerov, Anton A. Vasilev, Alexander Y. Poly
Published 2026-10-22
📖 4 min read☕ Coffee break read

Original authors: Lee-Woon Jang, Sang-Ik Lee, Andrej Kuznetsov, A.L. Zakgeim, E.B. Yakimov, Pil-Kyu Jang, Anton E. Chernyakov, Luiza A. Alexanyan, M. L. Skorikov, Ivan V. Shchemerov, Anton A. Vasilev, Alexander Y. Polyakov, Ih-Hwan Lee

Original paper licensed under CC BY 4.0 (https://creativecommons.org/licenses/by/4.0/). ✨ This is an AI-generated explanation of the paper below. It is not written or endorsed by the authors. For technical accuracy, refer to the original paper. Read full disclaimer

Imagine a world where the tiny lights that power our screens, from the augmented reality glasses of the future to the micro-projectors in our pockets, are made of a material so efficient it seems almost miraculous. These are micro-light-emitting diodes, or micro-LEDs, built from layers of crystal that glow when electricity passes through them. For decades, scientists have known that as these lights get smaller, they become less efficient. It is a frustrating paradox: the very act of shrinking a device to make it useful for wearable technology seems to break it. The culprit is usually the edges. When these tiny crystals are cut into their final shapes using powerful plasma beams, the process leaves behind a rough, damaged perimeter. This damaged edge acts like a leak in a bucket, allowing the energy meant to create light to escape as heat instead. The smaller the device, the larger this damaged edge becomes relative to the total size, causing the light to dim and the battery to drain faster.

A team of researchers from Korea, Russia, and Norway has now taken a close look at this problem, not just to confirm that the edges are damaged, but to measure exactly how bad the damage is and how to fix it. They focused on blue micro-LEDs, which are critical for high-resolution displays, and tested devices ranging from the size of a grain of sand down to the width of a human hair. By using a specialized electron microscope that can map out where light is being generated inside the device, they discovered that the damage from the cutting process extends about one micrometer inward from the edge. This might sound small, but for a tiny LED, it is a massive zone of destruction. In this one-micrometer strip, the material is so riddled with defects that it kills the light-producing process roughly ten to twenty times faster than the healthy material in the center of the device.

The researchers did not stop at measuring the problem; they tested two different ways to heal the edges. First, they dipped the devices in a chemical solution of potassium hydroxide, which acts like a gentle scrub to wash away the most severely damaged layer of crystal. This helped, but the edges were still not perfect. Next, they added a second step: after the chemical wash, they coated the sides with a thin layer of glass-like material called silicon dioxide. This coating acts as a seal, preventing electricity from leaking out the sides and stopping the remaining defects from interfering with the light. The results were striking. The devices that received both the chemical wash and the glass coating showed a dramatic improvement. The electrical current that usually leaks out the sides was reduced by a factor of one hundred compared to the untreated devices. More importantly, the efficiency of the light remained high even as the devices shrank to just five micrometers in diameter.

To understand exactly what was happening, the team looked at how the light behaved as they changed the size of the LED. They found that in untreated devices, the efficiency dropped off a cliff as soon as the diameter went below thirty micrometers. However, in the treated devices, this drop was much slower and more manageable. By comparing the size of the devices with the amount of light they produced, the researchers were able to calculate the density of the invisible defects causing the trouble. Their calculations confirmed that the damaged strip along the edge is the primary reason these tiny lights fail. While the chemical wash removed the worst of the physical damage, the glass coating was essential for stopping the electrical leakage that ruins the device's performance.

This work provides a clear roadmap for building the next generation of micro-displays. It shows that the "efficiency cliff" is not an unavoidable law of physics, but a solvable engineering challenge caused by specific defects at the edges. The study suggests that simply making the devices smaller is not enough; one must also manage the health of the perimeter. By combining a chemical cleaning process with a protective glass seal, it is possible to keep these microscopic lights bright and efficient, even when they are smaller than a speck of dust. This finding is crucial for anyone hoping to see high-quality, low-power displays in the near future, proving that with the right care, the edges of these tiny crystals can be made as strong as their centers.

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