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SimuScan-Agent: language-model orchestration of synthetic-data-driven autonomous atomic force microscopy

SimuScan-Agent is an LLM-orchestrated framework that integrates physics-informed synthetic data generation with adaptive acquisition strategies to enable autonomous, goal-directed atomic force microscopy, significantly reducing measurement time and area while enabling intelligent nanostructure characterization through natural language interaction.

Original authors: Ruben Millan-Solsona, Marti Checa, Yongtao Liu, Bernadeta Srijanto, Rama K. Vasudevan, Scott Retterer, Liam Collins

Published 2026-10-21
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Original authors: Ruben Millan-Solsona, Marti Checa, Yongtao Liu, Bernadeta Srijanto, Rama K. Vasudevan, Scott Retterer, Liam Collins

Original paper licensed under CC BY 4.0 (https://creativecommons.org/licenses/by/4.0/). ✨ This is an AI-generated explanation of the paper below. It is not written or endorsed by the authors. For technical accuracy, refer to the original paper. Read full disclaimer

Imagine trying to map a vast, unknown landscape using a single, slow-moving probe that can only see a tiny patch at a time. This is the daily reality for scientists using atomic force microscopy, a powerful tool that drags a microscopic needle across a surface to reveal the shape and texture of materials at the scale of atoms. While this technique can see details invisible to any other microscope, it has traditionally been a slow, rigid process. Scientists usually program the machine to scan a large area in a perfect grid, line by line, like a lawnmower cutting grass. This method guarantees that nothing is missed, but it is incredibly inefficient. If a scientist is looking for a rare, tiny feature hidden in a large field, the machine might spend hours scanning empty space before finally finding it, wasting time and resources. The challenge has long been how to make these machines smarter, allowing them to decide where to look next based on what they have already seen, rather than blindly following a pre-set path.

A team of researchers at Oak Ridge National Laboratory has taken a significant step toward solving this problem by creating a new system called SimuScan-Agent. This system acts as a bridge between a human's simple request and the complex, automated movements of the microscope. Instead of writing lines of code to tell the machine exactly what to do, a researcher can now describe their goal in plain English, such as "find rare triangular structures in this sample." The system then takes this instruction and orchestrates a series of automated steps. First, it creates a vast library of fake, or synthetic, images of the materials the researcher is interested in. These images are not random guesses; they are built using physics-based rules that mimic how the real microscope sees the world, complete with the noise and blur that real instruments produce. Because these images are generated by a computer, every single object in them comes with a perfect, automatic label telling the system exactly what it is.

Using these perfectly labeled synthetic images, the system trains a computer model to recognize the shapes it needs to find. Once the model is ready, the real experiment begins. The microscope starts scanning a large area, but instead of moving in a grid, it moves intelligently. After taking a single picture, the system analyzes what it sees and immediately decides where the next picture should be taken. If the model spots a common shape, it might move on quickly. If it detects a rare shape or is unsure about an area, it prioritizes that spot. This process, known as adaptive exploration, allows the microscope to focus its energy on the most interesting parts of the sample. In tests, this approach allowed the system to explore a large region of about 10 square millimeters while only scanning 17.2 percent of the available positions. In computer simulations, the method reduced the number of measurements needed by roughly 71 percent compared to the traditional grid-like scanning method.

The results of this experiment go beyond just saving time. The system did not just find the objects; it built a detailed library of every single structure it encountered. For each object, it recorded its location, its shape, and its unique texture. The researchers then used this library to distinguish between typical examples of a shape and unusual ones. They found that most of the structures looked exactly as expected, but the system successfully identified a few that were distorted, incomplete, or had strange surface features, likely due to flaws in how they were made. This ability to automatically sort through thousands of tiny structures and flag the unusual ones without human intervention opens a new door for materials science. It means researchers can now ask their microscopes to hunt for rare events or specific defects in large samples and get a comprehensive answer in a fraction of the time it used to take, all while learning more about the material's true nature as the experiment unfolds.

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