Study of Oxide Semiconductor ZnO with Deposition Temperatures Effect of on the Structural, Optical and Electrical Properties
This study demonstrates that depositing ZnO thin films via a spray pneumatic technique at 450°C yields optimal structural, optical, and electrical properties, including a maximum crystallite size of 15.19 nm, approximately 85% transparency, a band gap of 3.31 eV, and the lowest electrical resistivity of 0.064 Ω·cm.