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Van der Waals Epitaxial InSe Thin Films for High-Mobility Two-Dimensional Transistors

This paper demonstrates the successful growth of high-mobility, phase-pure InSe thin films on hexagonal boron nitride via van der Waals epitaxy, achieving a peak field-effect mobility of approximately 4,000 cm²/Vs through optimized molecular beam epitaxy conditions that ensure atomically abrupt interfaces and intrinsic phonon-limited transport.

Original authors: Imhwan Kim, Yoonkang Kim, Wonwoo Suh, Eunsu Lee, Hyunjun Jo, Kyusun Han, Myeongju Kim, Juhui Oh, Joon Young Park, Hongseok Oh, Hyeonjun Baek, Celesta S. Chang, Kyusang Lee, Chul-Ho Lee, Gyu-Chul Yi

Published 2026-09-23
📖 1 min read☕ Coffee break read

Original authors: Imhwan Kim, Yoonkang Kim, Wonwoo Suh, Eunsu Lee, Hyunjun Jo, Kyusun Han, Myeongju Kim, Juhui Oh, Joon Young Park, Hongseok Oh, Hyeonjun Baek, Celesta S. Chang, Kyusang Lee, Chul-Ho Lee, Gyu-Chul Yi

Original paper licensed under CC BY 4.0 (https://creativecommons.org/licenses/by/4.0/). ✨ This is an AI-generated explanation of the paper below. It is not written or endorsed by the authors. For technical accuracy, refer to the original paper. Read full disclaimer

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